Group description
The FINE Group has its origin in the group founded by Javier Piqueras (Professor Emeritus) in 1986. Since then, the group has been growing with the incorporation of some of the doctors trained in the group.
In its beginnings, the group was called Micro- and characterization of electronic materials and its research work has been directed to the study of various families of semiconductors by techniques associated with scanning electron microscopy (SEM). In the group, cathodoluminescence (CL) techniques, electron beam induced current (EBIC) and electroacoustic scanning microscopy have been developed. Subsequently, near field microscopy techniques (scanning tunneling microscopy (STM) and atomic force microscopy (AFM)) and confocal optical microscopy were incorporated. The equipment has been acquired through competitive projects during the last 25 years. Currently, the group consists of 11 researchers and 8 doctoral students, as can be seen in the Personnel section, grouped into two main lines of research, as described in the Research section.